Value Analysis Tear-Down:
        A New Process for Product Improvement & Innovation
 
            Author: Yoshihiko Sato & J.Jerry Kaufman
 
           Year:2005    Pages: 216
 
                            Price $ 47.95
 
 
 
This book presents, for the first time, a new technology for improving products and
innovating new and better products, first developed in Japan by Yoshihiko Sato.
Value analysis tear-down combines traditional tear-down with the technologies of
value analysis and value engineering. Within a few years of its public announcement
in Japan, value analysis tear-down was adopted by all eleven Japanese automobile
manufacturers, and many of the Japanese consumer electronics manufacturers. Jerry
Kaufman, based in Houston, Texas, is a recognized authority and author on value
engineering and value management, and has contributed much that is in these
technologies to the process described in this book. The result of his collaboration with
Mr. Sato is a process that helps engineers and managers reduce product cost, improve
quality, continuously improve existing products, and discover opportunities for innovative
change.
 
FEATURES
 
The first "how-to-do-it" book in English, it is written specifically for professionals in product
engineering, manufacturing engineering, and value engineering; and the managers of these
professionals, including plant managers, production managers, manufacturing executives,
and research and development executives. It will also be useful to manufacturing, marketing,
and management people concerned with product improvement, innovation, and improving
their company's competitive position. Value analysis tear-down can be applied in many
service and other industries, as well as in manufacturing; wherever there are physical
components to be improved or invented.
 
CONTENTS
 
  VA Tear-Down What Is It, How It Developed
  Value Analysis and VA Tear-Down
  The VA Tear-Down Process
  Applying VA Tear-Down to Issues of Concern
  Evaluating VA Tear-Down Results
  Other Measures Of Competitiveness With VA Tear-Down
  Summary
  Bibliography
  Appendix Worksheets
  Index
 
Please Send Your Order To:                   R Krishnan
                                                                 Manager (Information Products)
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